Author Info
Name
Affiliation
Papers
K. H. YIP
Product, Test and Failure AnalysisGlobalfoundriesSingapore
1
Collaborators
Citations 
PageRank 
8
0
0.34
Referers 
Referees 
References 
0
6
1
Title
Citations
PageRank
Year
Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern.00.342017