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P. T. NG
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Name
Affiliation
Papers
P. T. NG
Product, Test and Failure Analysis, GlobalFoundriesSingapore
1
Collaborators
Citations
PageRank
8
0
0.34
Referers
Referees
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0
0
0
Publications (1 rows)
Collaborators (8 rows)
Referers (0 rows)
Referees (0 rows)
Title
Citations
PageRank
Year
Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis.
0
0.34
2017
1