Author Info
Name
Affiliation
Papers
B. STAMPFER
CDL for Single Defect Spectroscopy at the Institute for Microelectronics,TU Wien,Austria
1
Collaborators
Citations 
PageRank 
5
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release00.342020