Title | Citations | PageRank | Year |
---|---|---|---|
Failure analysis on 14 nm FinFET devices with ESD CDM failure. | 0 | 0.34 | 2018 |
Economic evaluation on container shipping route selection. | 0 | 0.34 | 2018 |
Solving 28 nm I/O circuit reliability issue due to IC design weakness. | 0 | 0.34 | 2018 |