Name
Abstract | ||
|---|---|---|
Editor's note:As boundary scan technology continues to mature, engineers continue tofind innovative ways of using the IEEE Std. 1149.1 facilities throughout thelife cycle of a board. Lucent Technologies is at the forefront of thisdevelopment, and the authors here describe how they have expanded theuse and reuse of the IEEE 1149.1 board tests into a variety of additional testenvironments.ýR.G. (Ben) BennettsBennetts Associates |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1109/MDT.2003.1188258 | IEEE Design & Test of Computers |
Keywords | Field | DocType |
boundary scan,lucent technologies,ieee std,thelife cycle,additional testenvironments,bennettsbennetts associates,board test,tofind innovative way,life cycle | Boundary scan,Embedded software,System testing,Reuse,Logic testing,Computer science,Automatic testing,Electronic engineering,Hardware modules,Software testing | Journal |
Volume | Issue | ISSN |
20 | 2 | 0740-7475 |
Citations | PageRank | References |
2 | 0.65 | 0 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Bradford G. Van Treuren | 1 | 4 | 2.47 |
| Jose M. Miranda | 2 | 7 | 1.81 |