Title
Testing in 2100
Year
DOI
Venue
2000
10.1109/MDT.2000.10029
IEEE Design & Test of Computers
Field
DocType
Volume
Engineering drawing,Computer science,Computer engineering
Journal
17
Issue
ISSN
Citations 
4
0740-7475
0
PageRank 
References 
Authors
0.34
0
1
Name
Order
Citations
PageRank
Scott Davidson15622.93