Name
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/ECCTD.2011.6043836 | ECCTD |
Keywords | Field | DocType |
electro migration,reliability,current density,reliability engineering,electromigration | Current density,Computer science,Electronic engineering,Power grid,Optimization algorithm,Electromigration,Reliability engineering,Life time | Conference |
Citations | PageRank | References |
0 | 0.34 | 4 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Masahiro Fukui | 1 | 42 | 14.57 |
| Haruo Miki | 2 | 0 | 0.34 |
| Masaya Yoshikawa | 3 | 25 | 23.93 |
| Shuji Tsukiyama | 4 | 85 | 19.66 |