Name
Abstract | ||
|---|---|---|
Electromigration due to insufficient wire width can cause the premature failure of a circuit. The ongoing reduction of circuit feature sizes has aggravated the problem over the last couple of years, especially with analog circuits. It is therefore an important reliability issue to consider current densities already in the physical design stage. We present a new methodology capable of routing analog multi-terminal signal nets with current-dependent wire widths. It is based on current-driven wire planning which effectively determines all branch currents prior to detailed routing. We also discuss successful applications of our methodology in commercial analog circuit design. |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1145/1119772.1119946 | ASP-DAC |
Keywords | Field | DocType |
electromigration avoidance,new methodology,current-driven wire planning,analog circuit,analog multi-terminal signal net,detailed routing,current-dependent wire width,commercial analog circuit design,physical design stage,insufficient wire width,circuit feature size,analog circuits,integrated circuit layout,electromigration,current density,standard cell,physical design | Computer science,Circuit extraction,Circuit design,Electronic engineering,Integrated circuit design,Routing (electronic design automation),Physical design,Mixed-signal integrated circuit,Electronic circuit,Electrical engineering,Linear circuit | Conference |
ISBN | Citations | PageRank |
0-7803-7660-9 | 12 | 1.23 |
References | Authors | |
9 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jens Lienig | 1 | 255 | 31.18 |
| Göran Jerke | 2 | 34 | 5.19 |