Name
Abstract | ||
|---|---|---|
Simulation of automatically-generated test programs is the primary means for verifying complex hardware designs and random test program generators therefore play a major role in the verification process of micro-processors. The input for a test program generator is typically an abstract specification-a template-of the tests to be generated. Due to randomness, generators often encounter situations that were not anticipated when the test specification was written. We introduce the concept of adaptive test program generation, which is designed to handle these unforeseen situations. We propose a technique that defines unexpected events together with their alternative program specifications. When an event is detected, its corresponding alternative specification is injected into the test program. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1109/HLDVT.2002.1224433 | HLDVT |
Keywords | Field | DocType |
complex hardware design,test program generator,test specification,test program,abstract specification-a template-of,adaptive test program generation,random test program generator,alternative program specification,corresponding alternative specification,automatically-generated test program,adaptive testing,high level synthesis,random testing,formal verification | Design for testing,Automatic test pattern generation,Test Management Approach,Intelligent verification,Automatic test equipment,Computer science,Random test generator,Real-time computing,Program analysis,Formal methods | Conference |
ISBN | Citations | PageRank |
0-7803-7655-2 | 4 | 0.87 |
References | Authors | |
5 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| allon adir | 1 | 231 | 19.33 |
| roy emek | 2 | 136 | 13.59 |
| eitan marcus | 3 | 166 | 11.76 |