Name
Abstract | ||
|---|---|---|
The paper presents a methodology for studying the interactions between science and technology. Our approach rests mostly on patent citation and co-word analysis. In particular, this study aims to delineate intellectual spaces in thin-film technology in terms of science/technology interaction. The universe of thin-film patents can be viewed as the macro-level and starting point of our analysis. Applying a bottom-up approach, intellectual spaces at the micro-level are defined by tracing prominent concepts in publications, patents, and their citations of scientific literature. In another step, co-word analysis is used to generate meso-level topics and sub-topics. Overlapping structures and specificities that emerge are explored in the light of theoretical understanding of science-technology interactions. In particular, one can distinguish prominent concepts among patent citations that either co-occur in both thin-film publications and patents or reach out to one of the two sides. Future research may address the question to what extent one can interpret directionality into this. |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1023/A:1026244828759 | Scientometrics |
Keywords | Field | DocType |
Scientific Literature,Theoretical Understanding,Patent Citation,Overlap Structure,Intellectual Space | Scientific literature,Overlapping structures,Computer science,Patent citation,Citation,Scientific communication,Bibliometrics,Scientometrics,Epistemology | Journal |
Volume | Issue | ISSN |
58 | 2 | 1588-2861 |
Citations | PageRank | References |
19 | 2.44 | 6 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Sujit Bhattacharya | 1 | 105 | 13.00 |
| Hildrun Kretschmer | 2 | 415 | 47.95 |
| Martin Meyer | 3 | 685 | 59.62 |