Name
Title | ||
|---|---|---|
Reliability Demonstration Testing Method for Safety-Critical Embedded Applications Software |
Abstract | ||
|---|---|---|
In order to solve the problem that the fixed duration testing method, which based on the classical statistics, can’t satisfy the requirements of reliability testing for modern safety-critical embedded applications software due to the long testing duration, a hierarchical reliability demonstration approach was provided in this paper. The method unified architecture-based reliability modeling, maximum entropy principle and Bayesian inference. Numeral simulation shows that it is effective to reduce the testing duration without decreasing the confidence level for the testing results. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1109/ICESS.2008.76 | ICESS |
Keywords | Field | DocType |
confidence level,applications software,bayesian inference,architecture-based reliability modeling,reliability testing,long testing duration,hierarchical reliability demonstration approach,testing result,fixed duration testing method,classical statistic,testing duration,reliability demonstration testing method,reliability,statistics,numerical simulation,software architecture,software reliability,software testing,system testing,embedded systems,maximum entropy principle,satisfiability,application software,embedded computing,embedded software,testing,test methods,reliability engineering,statistical analysis,bayesian methods,software systems,entropy | Integration testing,Orthogonal array testing,Computer science,System testing,Real-time computing,Non-regression testing,White-box testing,Theoretical computer science,Software performance testing,Software reliability testing,Reliability engineering,Non-functional testing | Conference |
ISSN | ISBN | Citations |
2576-3504 | 978-0-7695-3287-5 | 0 |
PageRank | References | Authors |
0.34 | 7 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Zhidong Qin | 1 | 0 | 1.01 |
| Hui Chen | 2 | 0 | 1.01 |
| Youqun Shi | 3 | 11 | 5.04 |