Year | DOI | Venue |
---|---|---|
2001 | 10.1109/ISCAS.2001.921359 | ISCAS (3) |
Keywords | Field | DocType |
leakage current,chip,sampling methods,correlated double sampling,cmos technology,sensor array,infrared,dark current | Fixed-pattern noise,Correlated double sampling,Leakage (electronics),Computer science,CMOS,Dark current,Electronic engineering,Pixel,Infrared,Detector | Conference |
Citations | PageRank | References |
2 | 0.99 | 3 |
Authors | ||
4 |
Name | Order | Citations | PageRank |
---|---|---|---|
M. W. Ng | 1 | 2 | 0.99 |
Y. H. Chee | 2 | 2 | 1.32 |
Y. P. Xu | 3 | 2 | 1.32 |
G. Karunasiri | 4 | 2 | 0.99 |