Name
Title | ||
|---|---|---|
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits |
Abstract | ||
|---|---|---|
Path delay fault simulation performance on multi-cycle delay paths common in industrial designs is discussed using paths from a large block in a microprocessor and a functional test vector suite. We profile fault simulation performance using a novel ... |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1007/s10836-009-5136-0 | Journal of Electronic Testing: Theory and Applications |
Keywords | Field | DocType |
Mixed-signal SOC testing,Loopback testing,Fault masking,Specification | Test method,Loopback,SINAD,Total harmonic distortion,System on a chip,Adder,Masking (art),Computer science,Electronic engineering,Real-time computing,Mixed-signal integrated circuit | Conference |
Volume | Issue | ISSN |
26 | 1 | 0923-8174 |
ISBN | Citations | PageRank |
0-7695-2514-8 | 8 | 0.64 |
References | Authors | |
14 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hongjoong Shin | 1 | 52 | 5.27 |
| Byoungho Kim | 2 | 113 | 14.39 |
| J. Abraham | 3 | 4905 | 608.16 |