Name
Abstract | ||
|---|---|---|
Pseudorandom test techniques are widely used for measuring the impulse response (IR) for linear devices and Volterra kernels for nonlinear devices, especially in the acoustics domain. This paper studies the application of pseudorandom functional test techniques to linear and nonlinear MEMS Built-In-Self-Test (BIST). We will first present the classical pseudorandom BIST technique for Linear Time Invariant (LTI) systems which is based on the evaluation of the IR of the Device Under Test (DUT) stimulated by a Maximal Length Sequence (MLS). Then we will introduce a new type of pseudorandom stimuli called the Inverse-Repeat Sequence (IRS) that proves better immunity to noise and distortion than MLS. Next, we will illustrate the application of these techniques for weakly nonlinear, purely nonlinear and strongly nonlinear devices. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/DATE.2006.244039 | DATE |
Keywords | Field | DocType |
nonlinear device,pseudorandom test technique,classical pseudorandom bist technique,maximal length sequence,inverse-repeat sequence,pseudorandom functional bist,pseudorandom stimulus,pseudorandom functional test technique,nonlinear mems built-in-self-test,linear device,weakly nonlinear,device under test,nonlinear systems,impulse response,system testing,transient response,kernel,linear systems,accelerometers,noise,distortion,signal processing,functional testing,nonlinear acoustics,mems,linear time invariant | LTI system theory,Device under test,Nonlinear system,Linear system,Computer science,Pseudorandom binary sequence,Electronic engineering,Pseudorandom generator theorem,Built-in self-test,Pseudorandom number generator | Conference |
ISSN | ISBN | Citations |
1530-1591 | 3-9810801-0-6 | 6 |
PageRank | References | Authors |
0.76 | 8 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| A. Dhayni | 1 | 23 | 3.25 |
| S. Mir | 2 | 6 | 0.76 |
| L. Rufer | 3 | 35 | 6.75 |
| A. Bounceur | 4 | 25 | 2.21 |