Title
An improved biometrics technique based on metric learning approach
Abstract
A biometrics technique based on metric learning approach is proposed in this paper to achieve higher correct classification rates under the condition that the feature of the query is very different from that of the register for a given individual. Inspired by the definition of generalized distance, the criterion of this new metric learning is defined by finding an embedding that preserves local information and obtaining a subspace that best detects the essential manifold structure. Furthermore, the two transformation matrices for the query and the register are obtained by a generalized eigen-decomposition. Experiments tested on biometric applications of CASIA(B) gait database and the UMIST face database, demonstrate that our proposed method performs better than classical metric learning methods and the current radial basis function (RBF) algorithms.
Year
DOI
Venue
2012
10.1016/j.neucom.2012.06.022
Neurocomputing
Keywords
Field
DocType
generalized distance,new metric learning,classical metric learning method,generalized eigen-decomposition,improved biometrics technique,biometric application,metric learning approach,best detects,umist face database,gait database,face recognition
Facial recognition system,Radial basis function,Embedding,Pattern recognition,Subspace topology,Artificial intelligence,Biometrics,Transformation matrix,Essential manifold,Mathematics,Machine learning
Journal
Volume
ISSN
Citations 
97,
0925-2312
18
PageRank 
References 
Authors
0.72
32
4
Name
Order
Citations
PageRank
Xianye Ben113110.56
Weixiao Meng243054.79
Rui Yan3885.22
Kejun Wang425220.72