Name
Abstract | ||
|---|---|---|
The liquid crystal displays (LCDs) possess the most mature technology and best consuming competitiveness in the flat panel display (FPD) industries. Of all the LCDs, thin film transistor-liquid crystal display (TFT-LCD) keeps some real advantages. It is thinner, smaller and lighter than other displays and has low power consumption, low-radiation, high-contrast and high-dpi at the same time. Hence, the TFT-LCD panel is widely applied in daily electronic products, and the demand for the TFT-LCD panel increases. The product life cycle of the TFT-LCD panel is gradually getting into the mature stage, and meanwhile, Taiwan’s firms face fierce competition from South Korea and Japan. Thus, at present, continual cost reduction is an all-out pursuing topic for Taiwan’s panel manufacturers. If the quality and yield of the TFT-LCD panel can be effectively enhanced, the non-conforming rate and the cost of the TFT-LCD panel will be reduced. In this study, TFT-LCD panel manufacturing process is discussed, and then five critical-to-quality (CTQ) characteristics (or sub-processes) are identified and summarized. At the early stages, the assessing model of process quality index (Cpm) and the MAIC (i.e., measure-analyze-improve-control) approach of Six Sigma are used to measure and analyze the CTQ characteristics that make TFT-LCD panel unqualified and incapable. During the later stages, Hartley’s homogeneity test and joint confidence intervals were conducted to determine the optimal parameter setting of the critical factor in TFT-LCD panel manufacturing process. By using these optimal settings, Six Sigma quality level can be achieved. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1016/j.microrel.2005.10.003 | Microelectronics Reliability |
Keywords | Field | DocType |
confidence interval,product life cycle,liquid crystal display,quality improvement,six sigma,thin film transistor | Six Sigma,CTQ tree,Mature technology,Liquid-crystal display,Flat panel display,Engineering,Product lifecycle,Reliability engineering,Cost reduction,Quality management | Journal |
Volume | Issue | ISSN |
46 | 7 | 0026-2714 |
Citations | PageRank | References |
7 | 1.02 | 3 |
Authors | ||
3 | ||