Abstract | ||
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In this paper we extend an earlier worst case boundreliability theory to derive a worst case reliabilityfunction R(t), which gives the worst case probability ofsurviving a further time t given an estimate of residualdefects in the software N and a prior test time T.The earlier theory and its extension are presented andthe paper also considers the case where there is a lowprobability of any defect existing in the program. For the"fractional defect" case, there can be a high probabilityof surviving any subsequent time t. The implications ofthe theory are discussed and compared with alternativereliability models.Keywords: reliability prediction, reliability testing, worstcase reliability bound, residual fault prediction. |
Year | DOI | Venue |
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2002 | 10.1109/ISSRE.2002.1173274 | ISSRE |
Keywords | Field | DocType |
prior test time,reliability prediction,worst case probability,earlier theory,reliability testing,residual defects,subsequent time,worst case reliabilityfunction r,worst case reliability prediction,implications ofthe theory,worstcase reliability,worst case reliability bound,residual fault prediction.,earlier worst case boundreliability,computer aided software engineering,reliability engineering,software testing,reliability theory,software reliability,reliability function | Residual,Computer science,Software,Software quality,Reliability engineering,Reliability model,Reliability theory | Conference |
ISBN | Citations | PageRank |
0-8186-1763-3 | 5 | 0.53 |
References | Authors | |
7 | 2 |
Name | Order | Citations | PageRank |
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Peter G. Bishop | 1 | 60 | 7.97 |
Robin E. Bloomfield | 2 | 227 | 44.91 |