Title
Fabrication Of Inp/Ingaas Shbt On Si Substrate By Using Transferred Substrate Process
Abstract
With the aim of achieving heterogeneous integration of compound semiconductors with silicon technology, the fabrication of an InP/InGaAs transferred-substrate HBT (TS-HBT) on a Si substrate is reported. A current gain of 70 and a maximum current density of 12.3 mA/mu m(2) were confirmed in a TS-HBT with a 340-nm-wide emitter. From microwave characteristics of the TS-HBT obtained after deembedding, a cutoff frequency (f(T)) of 510 GHz and a 26% reduction of the base-collector capacitance were estimated. However, the observed f(T) was too high for an HBT with a 150-nm-thick collector. This discrepancy can be explained by the error in de-embedding, because an open pad is observed to have large capacitance and strong frequency dependence due to the conductivity of the Si substrate.
Year
DOI
Venue
2012
10.1587/transele.E95.C.1323
IEICE TRANSACTIONS ON ELECTRONICS
Keywords
Field
DocType
heterojunction bipolar transistor, InP, base-collector capacitance, transferred-substrate, heterogeneous integration
Substrate (chemistry),Electronic engineering,Engineering,Heterojunction bipolar transistor,Fabrication
Journal
Volume
Issue
ISSN
E95C
8
0916-8524
Citations 
PageRank 
References 
0
0.34
1
Authors
3
Name
Order
Citations
PageRank
Yutaro Yamaguchi110.70
Takeshi Sagai200.34
Yasuyuki Miyamoto314.68