Name
Abstract | ||
|---|---|---|
In this paper, we review the current status of single-event upsets caused by alpha-particles in IBM circuits and technology. While both alpha-particles and cosmic radiation can induce upsets, the alpha-particle-induced upset rate has become an increasingly important issue because alpha-particle-induced upsets are no longer limited to memory circuits. Latch circuits have become highly sensitive to alpha-particles. The alpha-particle-induced upset rate of latch circuits is one of the most critical issues for microprocessors requiring both high performance and high reliability. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1147/rd.523.0225 | IBM Journal of Research and Development |
Field | DocType | Volume |
Computer science,Microprocessor,Electronic engineering,CMOS,Upset,Electronic circuit,Memory circuits,Electrical engineering | Journal | 52 |
Issue | ISSN | Citations |
3 | 0018-8646 | 6 |
PageRank | References | Authors |
0.81 | 4 | 7 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| D. F. Heidel | 1 | 18 | 2.77 |
| K. P. Rodbell | 2 | 33 | 14.76 |
| E. H. Cannon | 3 | 24 | 2.89 |
| C. Cabral, Jr. | 4 | 16 | 2.57 |
| M. S. Gordon | 5 | 10 | 1.70 |
| P. Oldiges | 6 | 19 | 3.41 |
| H. H. K. Tang | 7 | 30 | 46.24 |