Title
Neural network based modeling of HfO2 thin film characteristics using Latin Hypercube Sampling
Abstract
In this paper, the neural network based modeling for electrical characteristics of the HfO2 thin films grown by metal organic molecular beam epitaxy was investigated. The accumulation capacitance and the hysteresis index are extracted to be the main responses to examine the characteristics of the HfO2 dielectric films. The input process parameters were extracted by analyzing the process conditions and the characterization of the films. X-ray diffraction was used to analyze the characteristic variation for the different process conditions. In order to build the process model, the neural network model using the error back-propagation algorithm was carried out and those initial weights and biases are selected by Latin Hypercube Sampling method. This modeling methodology can allow us to optimize the process recipes and improve the manufacturability.
Year
DOI
Venue
2007
10.1016/j.eswa.2005.11.032
Expert Systems with Applications
Keywords
Field
DocType
HfO2,Process modeling,Neural networks,Latin Hypercube Sampling
Data mining,Capacitance,Biological system,Computer science,Simulation,Dielectric,Process modeling,Hysteresis,Thin film,Artificial neural network,Design for manufacturability,Latin hypercube sampling
Journal
Volume
Issue
ISSN
32
2
0957-4174
Citations 
PageRank 
References 
2
0.46
0
Authors
6
Name
Order
Citations
PageRank
Kyoung Eun Kweon120.46
Jung Hwan Lee231.59
Young-Don Ko3124.16
Min-Chang Jeong420.80
Jae-Min Myoung5113.29
Ilgu Yun62512.28