Name
Abstract | ||
|---|---|---|
Most built-in self test (BIST) solutions require specialized test pattern generation hardware which may introduce significant area overhead and performance degradation. Recently, some authors proposed test pattern generation on chip by means of functional units also used in system mode like adders or multipliers. These schemes generate pseudo-random or pseudo-exhaustive patterns for serial or parallel BIST. If the circuit under test contains random pattern resistant faults a deterministic test pattern generator is necessary to obtain complete fault coverage. In this paper it is shown that a deterministic test set can be encoded as initial values of an accumulator based structure, and all testable faults can be detected within a given test length by carefully selecting the seeds of the accumulator. A ROM is added for storing the seeds, and the control logic of the accumulator is modified. In most cases the size of the ROM is less than the size required by traditional LFSR-based reseeding approaches |
Year | DOI | Venue |
|---|---|---|
1998 | 10.1109/TEST.1998.743181 | Washington, DC |
Keywords | Field | DocType |
built-in self test,functional unit,deterministic test set,size ofthe rom,deterministic test pattern,solutions requirespecialized test pattern,deterministic bist,control logicof,parallel bist,complete fault coverage,test patterngeneration,fault coverage,automatic test pattern generation,degradation,chip,hardware,read only memory,adders,system on a chip | Automatic test pattern generation,Pattern generation,Adder,Fault coverage,Computer science,Digital pattern generator,Real-time computing,Electronic engineering,Control logic,Accumulator (structured product),Built-in self-test | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-5093-6 | 52 |
PageRank | References | Authors |
3.44 | 23 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Rainer Dorsch | 1 | 135 | 12.60 |
| Hans-Joachim Wunderlich | 2 | 1822 | 155.30 |