Title
Accelerating Test Data Processing
Abstract
The speed of stimuli generation and response processing in mixed-signal BIST is often limited by the available operational throughput of the test circuitry (i.e., by the time taken to perform arithmetic operations required to produce test signals and to analyze the test responses). Application of the Messerschmitt transform known from the area of DSP can substantially increase the throughput by allowing pipelining not only feed-forward computations but also those related to the feedback (recursive) algorithms.
Year
DOI
Venue
1999
10.1109/ATS.1999.810738
Asian Test Symposium
Keywords
Field
DocType
response processing,test signal,accelerating test data processing,available operational throughput,mixed-signal bist,stimuli generation,arithmetic operation,test response,feed-forward computation,test circuitry,dsp,signal processing,signal analysis,signal generators,arithmetic,feed forward,recursive algorithm,throughput,data processing,feedback,pipelining
Pipeline (computing),Digital signal processing,Multidimensional signal processing,Computer science,Parallel computing,Electronic engineering,Real-time computing,Test data,Throughput,Recursion,Computation
Conference
ISBN
Citations 
PageRank 
0-7695-0315-2
0
0.34
References 
Authors
2
2
Name
Order
Citations
PageRank
Serge Demidenko1477.78
Kenneth Lever251.18