Title
Non-Linearity in Wide Dynamic Range CMOS Image Sensors Utilizing a Partial Charge Transfer Technique.
Abstract
The partial charge transfer technique can expand the dynamic range of a CMOS image sensor by synthesizing two types of signal, namely the long and short accumulation time signals. However the short accumulation time signal obtained from partial transfer operation suffers of non-linearity with respect to the incident light. In this paper, an analysis of the non-linearity in partial charge transfer technique has been carried, and the relationship between dynamic range and the non-linearity is studied. The results show that the non-linearity is caused by two factors, namely the current diffusion, which has an exponential relation with the potential barrier, and the initial condition of photodiodes in which it shows that the error in the high illumination region increases as the ratio of the long to the short accumulation time raises. Moreover, the increment of the saturation level of photodiodes also increases the error in the high illumination region.
Year
DOI
Venue
2009
10.3390/s91209452
SENSORS
Keywords
Field
DocType
electronic imaging,CMOS image sensor,wide dynamic range,partial charge transfer,non-linearity
Wide dynamic range,Time signal,Dynamic range,Ray,Image sensor,Partial charge,CMOS,Electronic engineering,Engineering,Photodiode
Journal
Volume
Issue
ISSN
9
12
1424-8220
Citations 
PageRank 
References 
3
0.44
4
Authors
4
Name
Order
Citations
PageRank
Suhaidi Shafie1217.17
Shoji Kawahito227067.13
Izhal Abdul Halin392.87
Wan Zuha Wan Hasan442.83