Name
Abstract | ||
|---|---|---|
This paper addresses the relations between logic circuit synthesis, error model and error control codes so that the efficient reliable logic circuits can be obtained. We propose that single fault masking capability of a random logic circuit can be obtained by encoding its outputs in a byte error correcting code; this is equivalent to that of the triple modulo redundancy (TMR) technique. Similarly, byte error detecting code can be used to provide an equivalence of duplication. In this paper, we address the problems and issues related to the realization of byte-organized configuration where the byte error control codes can be applied. Some MCNC benchmark circuits are used as examples to demonstrate the feasibility of the proposed concept. |
Year | DOI | Venue |
|---|---|---|
1996 | 10.1109/DFTVS.1996.572035 | DFT |
Keywords | Field | DocType |
circuit reliability,error correction codes,logic circuits,logic design,byte error control code,error model,random logic circuit synthesis,reliability,single fault masking | Logic synthesis,Byte,Logic gate,Computer science,Error detection and correction,Electronic engineering,Redundancy (engineering),Random logic,Electronic circuit,Encoding (memory) | Conference |
ISBN | Citations | PageRank |
0-8186-7545-4 | 5 | 0.56 |
References | Authors | |
6 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jien-Chung Lo | 1 | 189 | 28.32 |
| Masato Kitakami | 2 | 25 | 12.29 |
| Eiji Fujiwara | 3 | 180 | 31.14 |