Paper Info
Title
Acquisition Of Pn Sequences In Chip Synchronous Ds Ss Systems Using A Random Sequence Model And The Sprt
Abstract
The use of a sequential probability ratio test (SPRT) for the acquisition of pseudonoise (PN) sequences in chip synchronous direct-sequence spread-spectrum (DS/SS) systems is considered. The out-of-phase sequence is modeled as a random sequence and the probabilities of error and expected sample sizes for the corresponding test are derived. A different (and very commonly used) test is obtained if the out-of-phase sequence is modeled as a zero sequence. The probabilities of error and the expected sample sizes of both SPRT's are compared, and it is shown that the latter test has a significantly larger probability of type I error. Numerical evaluation of the performance of both tests applied to a PN sequence of period 2(10) - 1 gives results in agreement with the analytical results. We conclude that a random sequence is an excellent model for a PN sequence, and that significant degradation in performance can be expected if the test design is based on the zero sequence model rather than on the random sequence model.
Year
DOI
Venue
1994
10.1109/26.293684
IEEE TRANSACTIONS ON COMMUNICATIONS
DocType
Volume
Issue
Journal
42
6
ISSN
Citations 
PageRank 
0090-6778
15
1.74
References 
Authors
7
2
Name
Order
Citations
PageRank
K. K. Chawla1151.74
D. V. Sarwate2431121.44