Name
Year | DOI | Venue |
|---|---|---|
1991 | 10.1109/TEST.1991.519505 | ITC |
Keywords | Field | DocType |
productivity,manufacturing,design for testability,microcontrollers,modular design,automatic test pattern generation,central processing unit | Design for testing,Automatic test pattern generation,Central processing unit,Grading (education),Test Management Approach,Computer science,Microcontroller,Modular design,Test strategy,Reliability engineering | Conference |
ISBN | Citations | PageRank |
0-8186-9156-5 | 0 | 0.34 |
References | Authors | |
1 | 6 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Tony Cheng | 1 | 0 | 0.34 |
| Eric Hoang | 2 | 1 | 0.83 |
| David Rivera | 3 | 0 | 0.34 |
| Alan Haedge | 4 | 0 | 0.34 |
| Jamie Fontenot | 5 | 0 | 0.34 |
| Glenn Carson | 6 | 0 | 0.34 |