Name
Title | ||
|---|---|---|
ΔIDDQ Testing of a CMOS Digital-to-Analog Converter Considering Process Variation Effects. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.4236/cs.2011.23020 | Circuits and Systems |
Keywords | Field | DocType |
testing,process variation | Fault detection and isolation,Computer science,Frequency deviation,Electronic engineering,Converters,CMOS,Digital-to-analog converter,Current sensor,Process variation,Electronic circuit,Electrical engineering | Journal |
Volume | Issue | Citations |
2 | 3 | 0 |
PageRank | References | Authors |
0.34 | 4 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Rajiv Soundararajan | 1 | 782 | 33.20 |
| Ashok N. Srivastava | 2 | 405 | 45.20 |
| Siva Sankar Yellampalli | 3 | 74 | 5.20 |