Name
Title | ||
|---|---|---|
An Efficient Design-for-testability Scheme for 2-D Transform in H.264 Advanced Video Coders |
Abstract | ||
|---|---|---|
In this paper, an easily design-for-testability (DfT) scheme based on C-testability conditions is adopted to implement test syntheses of the 2-D forward, inverse and Hadamard transforms suggested in H.264 advanced video coders (AVC). The proposed testable scheme is applied to bit-level regular arrangement for the transform architecture. It guarantees 100% fault coverage while the resulting number of test pattern is only 8. The proposed integrated transforms have been synthesized with UMC 0.18 mum technology. Under the small performance degradation, simulation results show that the DfT implementation increases about only 12% area overhead compared with the original circuit |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/APCCAS.2006.342380 | APCCAS |
Keywords | Field | DocType |
2d transform,c-testability conditions,design-for-testability scheme,h.264 advanced video coders,hadamard transforms,inverse transforms,dft scheme,design for testability,0.18 micron,video codecs,fault coverage,integral transforms | Design for testing,Inverse,Fault coverage,Computer science,Electronic engineering,Hadamard transform | Conference |
ISBN | Citations | PageRank |
1-4244-0387-1 | 0 | 0.34 |
References | Authors | |
1 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Heng-yao Lin | 1 | 67 | 5.96 |
| Hui-hsien Tsai | 2 | 11 | 1.45 |
| Bin-da Liu | 3 | 563 | 66.56 |
| Jar-Ferr Yang | 4 | 1115 | 142.85 |
| Soon-Jyh Chang | 5 | 655 | 73.67 |