Title
Hilbertian Metrics on Probability Measures and Their Application in SVM?s
Abstract
In this article we investigate the field of Hilbertian metrics on probability measures. Since they are very versatile and can therefore be applied in various problems they are of great interest in kernel methods. Quit recently Topsoe and Fuglede introduced a family of Hilbertian metrics on probability measures. We give basic properties of the Hilbertian metrics of this family and other used metrics in the literature. Then we propose an extension of the considered metrics which incorporates structural information of the probability space into the Hilbertian metric. Finally we compare all proposed metrics in an image and text classification problem using histogram data.
Year
DOI
Venue
2004
10.1007/978-3-540-28649-3_33
PATTERN RECOGNITION
Keywords
Field
DocType
artificial intelligence,pattern recognition,histogram,image classification,probability measure,information retrieval,kernel method,metric space,metric,content analysis
Equivalence of metrics,Histogram,Color space,Computer science,Probability measure,Support vector machine,Artificial intelligence,Metric space,Kernel method,Contextual image classification,Machine learning
Conference
Volume
ISSN
Citations 
3175
0302-9743
6
PageRank 
References 
Authors
2.11
4
3
Name
Order
Citations
PageRank
Matthias Hein166362.80
Thomas Navin Lal21982122.60
Olivier Bousquet34593359.65