Paper Info
Title
Simple photonic emission analysis of AES: photonic side channel analysis for the rest of us
Abstract
This work presents a novel low-cost optoelectronic setup for time- and spatially resolved analysis of photonic emissions and a corresponding methodology, Simple Photonic Emission Analysis (SPEA). Observing the backside of ICs, the system captures extremly weak photoemissions from switching transistors and relates them to program running in the chip. SPEA utilizes both spatial and temporal information about these emissions to perform side channel analysis of ICs. We successfully performed SPEA of a proof-of-concept AES implementation and were able to recover the full AES secret key by monitoring accesses to the S-Box. This attack directly exploits the side channel leakage of a single transistor and requires no additional data processing. The system costs and the necessary time for an attack are comparable to power analysis techniques. The presented approach significantly reduces the amount of effort required to perform attacks based on photonic emission analysis and allows AES key recovery in a relevant amount of time.
Year
DOI
Venue
2012
10.1007/978-3-642-33027-8_3
CHES
Keywords
Field
DocType
simple photonic emission analysis,side channel analysis,side channel leakage,necessary time,full aes secret key,photonic side channel analysis,power analysis technique,photonic emission analysis,aes key recovery,relevant amount,proof-of-concept aes implementation,photonic emission,aes,spatial analysis,optical
Power analysis,Data processing,Telecommunications,Leakage (electronics),Computer science,Parallel computing,Chip,Electronic engineering,Side channel attack,Transistor,Photonics,AES implementations
Conference
Volume
ISSN
Citations 
7428
0302-9743
14
PageRank 
References 
Authors
0.78
11
5
Name
Order
Citations
PageRank
Alexander Schlösser1523.42
Dmitry Nedospasov220911.52
Juliane Krämer3747.52
Susanna Orlic4452.87
Jean-Pierre Seifert5375.43