Name
Abstract | ||
|---|---|---|
The robustness of least squares (LS) algorithms combined with the increased processing capabilities of DSPs will enable the development of a new brand of low-cost flexible instrumentation based on LS methods. Sine-fitting algorithms estimate the sine wave parameters of a digitized signal by minimizing the LS error. They can be used in a large number of important applications such as characterizati... |
Year | DOI | Venue |
|---|---|---|
2007 | 10.1109/TIM.2007.899873 | IEEE Transactions on Instrumentation and Measurement |
Keywords | Field | DocType |
Least squares methods,Convergence,Robustness,Digital signal processing,Instruments,Analog-digital conversion,Impedance measurement,Frequency measurement,System testing,Frequency response | Least squares,Convergence (routing),Signal processing,Frequency response,Linear system,Computer science,Harmonic,Electronic engineering,Robustness (computer science),Sine wave | Journal |
Volume | Issue | ISSN |
56 | 4 | 0018-9456 |
Citations | PageRank | References |
7 | 1.29 | 7 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Pedro M. Ramos | 1 | 115 | 17.91 |
| A. Cruz Serra | 2 | 123 | 20.70 |