Name
Abstract | ||
|---|---|---|
The state of the art of the research on modelling of analog-to-digital converter (ADC)-based measuring devices is surveyed. Main topics of modelling are reviewed according to the fields of prevailing scientific interest in metrological research such as quantization models, error models, and correction-aimed models. In these fields, recent developments are analysed with the aim of focusing both the contemporary situation and the imminent trends. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1016/S0920-5489(03)00060-6 | Computer Standards & Interfaces |
Keywords | Field | DocType |
ADC,Modelling,Error models,Quantization models,Error correction | Measuring instrument,Simulation,Computer science,Metrology,Error detection and correction,Real-time computing,Electronic engineering,Quantization (signal processing) | Journal |
Volume | Issue | ISSN |
26 | 1 | 0920-5489 |
Citations | PageRank | References |
7 | 1.14 | 17 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Pasquale Arpaia | 1 | 95 | 29.77 |
| Daponte, P. | 2 | 247 | 49.35 |
| Sergio Rapuano | 3 | 186 | 31.76 |