Name
Abstract | ||
|---|---|---|
The test of radiofrequency (RF) integrated circuits at their ever-increasing operating frequency range requires sophisticated test equipment and is time-consuming and, therefore, very expensive. This paper introduces a new method combining low-frequency actuation signal as test stimuli and signal envelope detection applied on the RF output signal in order to provide a low-cost mean for production testing of RF MEMS switches embedded in system-in-package (SiP) devices. The proposed approach uses the principle of alternate test that replaces conventional specification-based testing procedures. The basic idea is to extract the high-frequency characteristics of the switch from the signal envelope of the response. Output parameters like "on" and "off" transition time are extracted at low frequency and used in a regression process to predict RF conventional specifications like S-parameters. The paper also provides a set of recursive estimation algorithms suitable for online testing. In this context, "on" and "off" transition time estimated from the output low-frequency envelope is used as test metrics and is concurrently updated using recursive algorithms. Validation results obtained on a capacitive RF switch model are presented. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1155/2008/294014 | VLSI Design |
Keywords | Field | DocType |
rf conventional specification,rf output signal,capacitive rf switch model,test metrics,signal envelope detection,low-frequency actuation signal,rf mems,transition time,offline rf mems switch,sophisticated test equipment,test stimulus,alternate test | Low frequency,Microelectromechanical systems,Computer science,Capacitive sensing,Real-time computing,Electronic engineering,Online and offline,Signal envelope,RF switch,Integrated circuit,Recursion | Journal |
Volume | Issue | ISSN |
2008 | 3 | 1065-514X |
Citations | PageRank | References |
1 | 0.43 | 4 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| E. Simeu | 1 | 17 | 4.26 |
| H. -N. Nguyen | 2 | 1 | 1.44 |
| P. Cauvet | 3 | 17 | 4.34 |
| S. Mir | 4 | 1 | 0.43 |
| L. Rufer | 5 | 35 | 6.75 |
| R. Khereddine | 6 | 1 | 0.43 |