Name
Year | DOI | Venue |
|---|---|---|
2012 | 10.1109/VTS.2012.6231075 | VTS |
Keywords | Field | DocType |
CMOS integrated circuits,analogue circuits,fault simulation,integrated circuit modelling,integrated circuit reliability,integrated circuit testing,production testing,radiofrequency integrated circuits,statistical analysis,IBM RF front-end,RF CMOS technology,analog-RF device test ordering,defective devices,device under test,fault simulation,feature selection techniques,functional circuits,production testing,redundant test identification,statistical model,virtual circuit sampling,virtual defective circuits,Analog/RF test,feature selection,functional test,statistical modeling,test ordering | Device under test,Feature selection,Computer science,CMOS,Radio frequency,Electronic engineering,Statistical model,Virtual circuit,Electronic circuit,Small set | Conference |
Citations | PageRank | References |
3 | 0.44 | 0 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Nourredine Akkouche | 1 | 3 | 0.44 |
| Salvador Mir | 2 | 426 | 56.22 |
| Emmanuel Simeu | 3 | 90 | 16.55 |
| Mustapha Slamani | 4 | 134 | 17.09 |