Name
Year | DOI | Venue |
|---|---|---|
1990 | 10.1109/FTCS.1990.89381 | FTCS |
Keywords | Field | DocType |
CMOS integrated circuits,built-in self test,microprocessor chips,1.5 micron,32 bit,CMOS,application program,built-in on-line test,control flow checking,microprocessors,sequencing,silicon,verification | 32-bit,Control theory,Cost Comparisons,Computer science,Control flow,Microprocessor,CMOS,Invariant (mathematics),Built-in self-test,Embedded system | Conference |
Citations | PageRank | References |
12 | 1.22 | 0 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Régis Leveugle | 1 | 354 | 44.83 |
| T. Michel | 2 | 62 | 4.54 |
| Gabriele Saucier | 3 | 265 | 47.51 |