Abstract | ||
---|---|---|
The paper presents the concept and the verification of a novel silicon monolithic active pixel detector realized in the SOI technology. The reliability and the basic electrical characteristics of the sensor are studied and the sensor sensitivity to the ionising radiation is investigated in details. |
Year | DOI | Venue |
---|---|---|
2005 | 10.1016/j.microrel.2004.10.014 | Microelectronics Reliability |
Field | DocType | Volume |
Silicon on insulator,Pixel detector,Electronic engineering,CMOS sensor,Engineering,Integrated circuit,Electrical engineering,Silicon | Journal | 45 |
Issue | ISSN | Citations |
7 | 0026-2714 | 0 |
PageRank | References | Authors |
0.34 | 0 | 12 |
Name | Order | Citations | PageRank |
---|---|---|---|
H. Niemiec | 1 | 0 | 0.34 |
A. Bulgheroni | 2 | 0 | 0.34 |
M. Caccia | 3 | 0 | 0.34 |
P. Grabiec | 4 | 0 | 0.68 |
M. Grodner | 5 | 0 | 0.68 |
M. Jastrzab | 6 | 0 | 0.34 |
W. Kucewicz | 7 | 0 | 0.68 |
K. Kucharski | 8 | 2 | 1.17 |
S. Kuta | 9 | 7 | 2.18 |
J. Marczewski | 10 | 2 | 1.84 |
M. Sapor | 11 | 0 | 0.68 |
D. Tomaszewski | 12 | 0 | 1.01 |