Name
Abstract | ||
|---|---|---|
Abstract This paper deals with the estimation of the median time-to-failure (MTF) due to elec-tromigration in the power and ground busses of CMOS VLSI circuits. In our previous work [3, 4], we presented a novel technique for MTF estimation based on a stochastic cur-rent waveform model. In [6], we argued that including the variance waveform of the current, in addition to its expected waveform derived in [3, 4], would further improve the accuracy of the MTF estimate. In this paper, we present a novel technique for deriving the variance waveform for CMOS circuits. Using this technique, we establish the importance of the vari-ance waveform by showing that its contribution to the MTF estimate can be in the range of 100% to 200% relative to that of the expected waveform. The technique has been built into the probabilistic simulator CREST [3, 4], and has shown good agreement with SPICE, as well as excellent speedup. |
Year | DOI | Venue |
|---|---|---|
1989 | 10.1109/ICCAD.1989.76936 | ICCAD |
Field | DocType | Citations |
Computer science,Spice,Waveform,Real-time computing,CMOS,Electronic engineering,Probabilistic logic,Electronic circuit,Very-large-scale integration,Speedup,Computation | Conference | 2 |
PageRank | References | Authors |
0.48 | 4 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| F. N. Najm | 1 | 2097 | 571.66 |
| Ibrahim Hajj | 2 | 74 | 9.03 |
| Ping Yang | 3 | 407 | 200.75 |