Name
Title | ||
|---|---|---|
The Identification of Thin Dielectric Objects from Far Field or Near Field Scattering Data |
Abstract | ||
|---|---|---|
We consider the inverse scattering problem of determining the shape and the material properties of a thin dielectric infinite cylinder having an open arc as cross section from knowledge of the TM-polarized scattered electromagnetic field at a fixed frequency. We investigate two reconstruction approaches, namely the linear sampling method and the reciprocity gap functional method, using far field or near field data, respectively. Numerical examples are given showing the efficaciousness of our algorithms. |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1137/070711542 | SIAM JOURNAL ON APPLIED MATHEMATICS |
Keywords | Field | DocType |
direct and inverse scattering,scattering from cracks,linear sampling method,electromagnetic scattering,reciprocity gap functional method,thin dielectric objects | Dielectric,Mathematical analysis,Cylinder,Near and far field,Scattering,Sampling (statistics),Material properties,Electromagnetic field,Inverse scattering problem,Physics | Journal |
Volume | Issue | ISSN |
69 | 4 | 0036-1399 |
Citations | PageRank | References |
0 | 0.34 | 2 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Noam Zeev | 1 | 0 | 0.34 |
| Fioralba Cakoni | 2 | 54 | 15.93 |