Name
Abstract | ||
|---|---|---|
This paper presents an innovative algorithm for theautomatic generation of March Tests. The proposedapproach is able to generate an optimal March Test foran unconstrained set of memory faults in very lowcomputation time. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1109/DATE.2002.998412 | DATE |
Keywords | Field | DocType |
automatic test pattern generation,fault diagnosis,integrated memory circuits,logic testing,optimisation,random-access storage,March element sequence,March test automatic generation,March test complexity,RAM,ascending memory cell order,descending memory cell order,memory cell basic read/write operations,optimal test sequence algorithm,unconstrained memory fault set | Dram,Automatic test pattern generation,Algorithm design,Read-write memory,Computer science,Memory faults,Parallel computing,Algorithm,Random access,Memory cell,Computation | Conference |
ISBN | Citations | PageRank |
0-7695-1471-5 | 7 | 0.65 |
References | Authors | |
7 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| A. Benso | 1 | 148 | 12.69 |
| S. Di Carlo | 2 | 128 | 9.63 |
| G. Di Natale | 3 | 111 | 8.87 |
| P. Prinetto | 4 | 516 | 55.23 |