Name
Abstract | ||
|---|---|---|
This paper presents a novel test point insertion technique which, unlike the previous ones, is based on a constructive methodology A divide and conquer approach is used to partition the entire test into multiple phases. In each phase a group of test points targeting a specific set of faults is selected. Control points within a particular phase are enabled by fixed values, resulting in a simple and natural sharing of the logic driving them. Experimental results demonstrate that complete or near-complete stuck-at fault coverage can be achieved by the proposed technique with the insertion of a few test points and a minimum number of phases. |
Year | DOI | Venue |
|---|---|---|
1996 | 10.1109/TEST.1996.557122 | ITC |
Keywords | Field | DocType |
boundary scan testing,built-in self test,divide and conquer methods,fault diagnosis,integrated circuit testing,logic testing,constructive methodology,divide and conquer approach,fixed values,multi-phase test point insertion,near-complete stuck-at fault coverage,scan-based BIST,test points | Stuck-at fault,Boundary scan,Automatic test pattern generation,Fault coverage,Computer science,Algorithm,Scan chain,Electronic engineering,Divide and conquer algorithms,Test compression,Built-in self-test | Conference |
ISBN | Citations | PageRank |
0-7803-3541-4 | 74 | 6.70 |
References | Authors | |
12 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Nagesh Tamarapalli | 1 | 772 | 58.83 |
| Janusz Rajski | 2 | 2460 | 201.28 |