Name
Title | ||
|---|---|---|
Minimum Enclosing and Maximum Excluding Machine for Pattern Description and Discrimination |
Abstract | ||
|---|---|---|
This work addresses the description problem of a target class in the presence of negative samples or outliers. Traditional support vector machines (SVM) has strong discrimination capability to distinguish the target class but does not reject the uncharacteristic patterns well. The one-class SVM, on the other hand, provides good representation for the class of interest but overlooks the discrimination issue between the class and outliers. This paper presents a new one-class classifier named minimum enclosing and maximum excluding machine (MEMEM), which offers capabilities for both pattern description and discrimination. The properties of MEMEM are analyzed and the performance comparisons using synthetic and real data are presented |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/ICPR.2006.799 | ICPR (3) |
Keywords | Field | DocType |
pattern description,target class,traditional support,minimum enclosing machine,strong discrimination capability,maximum excluding machine,good representation,minimum enclosing,pattern classification,one-class svm,new one-class,pattern discrimination,vector machines,discrimination issue,description problem,one-class classifier,support vector machines,discrimination capability,support vector machine | Structured support vector machine,Pattern recognition,Computer science,Pattern discrimination,Support vector machine,Outlier,Artificial intelligence,Relevance vector machine,Margin classifier,Classifier (linguistics),Machine learning | Conference |
Volume | ISSN | ISBN |
3 | 1051-4651 | 0-7695-2521-0 |
Citations | PageRank | References |
11 | 0.75 | 6 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yi Liu | 1 | 28 | 3.86 |
| Yuan F. Zheng | 2 | 1073 | 283.25 |