Name
Title | ||
|---|---|---|
On robustness of required random test length with regard to fault occurrence hypotheses. |
Year | DOI | Venue |
|---|---|---|
1994 | 10.1109/VTEST.1994.292290 | VTS |
Keywords | Field | DocType |
combinatorial circuits,fault location,logic testing,probability,combinational circuits,fault distribution,fault occurrence,fault occurrence probabilities,random test length evaluation,tested circuit batch | Computer-aided manufacturing,Digital electronics,Computer science,Logic testing,Fault detection and isolation,Combinational logic,Electronic engineering,Robustness (computer science),Real-time computing,Electronic circuit,Reliability engineering,Fault occurrence | Conference |
Citations | PageRank | References |
2 | 0.40 | 11 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| S. Crepaux-Motte | 1 | 10 | 1.12 |
| Mireille Jacomino | 2 | 77 | 11.17 |
| René David | 3 | 22 | 2.82 |