Name
Abstract | ||
|---|---|---|
This paper reports a software system EYES (Edinburgh Yield Estimator Sampling) for the yield prediction of ULSI devices. The system implements the survey sampling based methodology for critical area estimation and yield prediction. This methodology is not limited by the size of the device or the design hierarchy and can provide yield predictions in a reasonable time for even the largest devices, using modest computing resources. |
Year | DOI | Venue |
|---|---|---|
1996 | 10.1109/DFTVS.1996.571983 | DFT |
Keywords | Field | DocType |
ULSI,integrated circuit yield,EYES tool,Edinburgh Yield Estimator Sampling,ULSI device,critical area estimation,software system,survey sampling,yield prediction | Algorithm design,Computer science,Survey sampling,Electronic engineering,Software system,Robustness (computer science),Application-specific integrated circuit,Critical area,Sampling (statistics),Estimator | Conference |
ISBN | Citations | PageRank |
0-8186-7545-4 | 5 | 1.13 |
References | Authors | |
6 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Gerard A. Allan | 1 | 23 | 4.40 |
| Anthony J. Walton | 2 | 35 | 6.28 |