Name
Abstract | ||
|---|---|---|
This paper presents principles and results of dynamic testing of an SRAM-based FPGA using time-resolved fault injection with a pulsed laser. The synchronization setup and experimental procedure are detailed. Fault injection results obtained with a DES crypto-core application implemented on a Xilinx Virtex II are discussed. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1109/IOLTS.2008.39 | IOLTS |
Keywords | Field | DocType |
synchronization setup,des crypto-core application,sram-based fpga,pulsed laser,time-resolved fault injection,experimental procedure,fault injection result,time-resolved laser fault injection,dynamic testing,xilinx virtex ii,lenses,signal generators,automotive engineering,electromagnetics,cryptography,heart,security,cmos integrated circuits,cmos technology,beams,adaptive optics,jitter,reliability,logic gates,vehicle dynamics,oscillators,semiconductor lasers,robustness,fpga,lasers,microscopy,generators,stress,testing,data visualization,multiplexing,embedded system,integrated circuits,art,phase locked loops,photoconductivity,field programmable gate arrays,system on a chip,automation,dynamic scheduling,frequency control,synchronisation,synchronization | Synchronization,System on a chip,Computer science,Electromagnetics,Field-programmable gate array,Robustness (computer science),Electronic engineering,Dynamic testing,Real-time computing,Virtex,Fault injection,Embedded system | Conference |
ISSN | Citations | PageRank |
1942-9398 | 5 | 0.80 |
References | Authors | |
2 | 7 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| V. Pouget | 1 | 51 | 11.38 |
| A. Douin | 2 | 20 | 3.40 |
| Gilles Foucard | 3 | 9 | 1.26 |
| Paul Peronnard | 4 | 15 | 2.32 |
| D. Lewis | 5 | 36 | 8.96 |
| Pascal Fouillat | 6 | 58 | 14.00 |
| R. Velazco | 7 | 5 | 0.80 |