Title
Circuit Simulation Model For Ultimately-Scaled Ballistic Nanowire Mosfets
Abstract
To innovate new devices such as nanowire (NW) metal-oxide-semiconductor field-effect transistors (MOSFETs), fully analytic and explicit models become vastly more important as TCAD tools for device design and circuit simulation, but such tools have yet to be reported. In the present article, we propose a fully analytic and explicit model of ballistic and quasi-ballistic NW MOSFETs. Device properties are derived analytically in terms of one common parameter. This common parameter is obtained analytically by means of a one-of-a-kind approximation technique, which also achieves the desired fully analytic and explicit model. Finally, we demonstrate circuit simulations using the model.
Year
DOI
Venue
2013
10.1587/elex.10.20120906
IEICE ELECTRONICS EXPRESS
Keywords
Field
DocType
NW MOSFET, fully analytic and explicit model, circuit simulation, quantum transport, drain-induced barrier lowering
Quantum transport,Computer science,Channel length modulation,Electronic engineering,Nanowire,Drain-induced barrier lowering
Journal
Volume
Issue
ISSN
10
1
1349-2543
Citations 
PageRank 
References 
0
0.34
0
Authors
3
Name
Order
Citations
PageRank
Tatsuhiro Numata100.34
Shigeyasu Uno242.34
Kazuo Nakazato33715.05