Name
Year | DOI | Venue |
|---|---|---|
1993 | 10.1109/ISCAS.1993.394043 | ISCAS |
Keywords | Field | DocType |
analogue-digital conversion,automatic testing,circuit analysis computing,digital simulation,digital-analogue conversion,integrated circuit testing,On-chip Reconfigurable Conversion System,dedicated test model,digital-to-analog-analog-to-digital testing loop,high-speed conversion system,purely-digital techniques | Testability,Dynamic range,System on a chip,Computer science,System testing,Signal-to-noise ratio,Automatic testing,Electronic engineering | Conference |
Citations | PageRank | References |
0 | 0.34 | 2 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| J. C. Vital | 1 | 41 | 6.55 |
| José E. Franca | 2 | 44 | 16.33 |
| Nuno S. Silva | 3 | 0 | 0.34 |