Title
Logic BIST Architecture Using Staggered Launch-on-Shift for Testing Designs Containing Asynchronous Clock Domains
Abstract
This paper presents a new at-speed logic built-in self-test (BIST) architecture using staggered launch-on-shift (LOS) for testing a scan-based BIST design containing asynchronous clock domains. The proposed approach can detect inter-clock-domain structural faults and intra-clock-domain delay and structural faults in the BIST design. This solves the long-standing problem of using the conventional one-hot LOS approach that requires testing one clock domain at a time which causes long test time or using the simultaneous LOS approach that requires adding capture-disabled circuitry to normal functional paths across interacting clock domains which causes fault coverage loss. Given a fixed number of BIST patterns, experimental results showed that the proposed staggered clocking scheme can detect more faults than one-hot clocking and simultaneous clocking.
Year
DOI
Venue
2010
10.1109/DFT.2010.50
DFT
Keywords
Field
DocType
at-speed logic built-in self-test,double-capture,single-capture,proposed staggered clocking scheme,capture-disabled circuitry,staggered launch-on-shift,intraclock-domain delay,bist pattern,bist design,scan-based bist design,staggered launch-on-capture,testing designs,built-in self test,clocks,asynchronous clock domain,asynchronous clock domains,clock domain,interacting clock domain,logic bist architecture,one-hot clocking,interclock-domain structural faults,los approach,logic testing,frequency domain analysis,synchronization,fault coverage
Frequency domain,Asynchronous communication,Synchronization,Architecture,Fault coverage,Computer science,Logic testing,Electronic engineering,Real-time computing,Built-in self-test,Embedded system
Conference
ISSN
ISBN
Citations 
1550-5774
978-1-4244-8447-8
5
PageRank 
References 
Authors
0.59
16
12
Name
Order
Citations
PageRank
Shianling Wu116526.85
Laung-terng Wang260144.22
Lizhen Yu3122.89
Hiroshi Furukawa421131.32
Xiaoqing Wen579077.12
Wen-Ben Jone641946.30
Nur A. Touba71929123.42
Feifei Zhao8174.29
Jinsong Liu9222.21
Hao-Jan Chao10304.46
Fangfang Li11151.94
Zhigang Jiang128520.12