Name
Title | ||
|---|---|---|
Using Self-Reconfiguration to Increase Manufacturing Yield of CNTFET-based Architectures |
Abstract | ||
|---|---|---|
Among the key issues facing the semiconductor industry as increasingly unreliable emerging and nanoscale technologies come to the fore are design reliability and manufacturing yield. In this paper, we propose a fault-tolerant architecture based on Carbon Nanotube Field-Effect-Transistors (CNTFET). The architecture is composed of statically interconnected reconfigurable cells. Static interconnects offer possibilities for scalable and low power circuits while cell reconfiguration is extensively used to increase the architecture fault-tolerance. We show that in the proposed architecture, for a 96% carbon nanotube manufacturing yield, up to 83% of the hardware resources can still be used. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/ReConFig.2011.92 | ReConFig |
Keywords | Field | DocType |
manufacturing yield,hardware resource,architecture fault-tolerance,cntfet-based architectures,carbon nanotube field-effect-transistors,carbon nanotube manufacturing yield,cell reconfiguration,key issue,fault-tolerant architecture,design reliability,proposed architecture,hardware,fault tolerant,field programmable gate arrays,computer architecture,manufacturing,carbon nanotube,field programmable gate array,field effect transistor,fault tolerance,fault tolerant system,cntfet | Architecture,Computer science,Parallel computing,Field-programmable gate array,Fault tolerance,Power circuits,Carbon nanotube field-effect transistor,Semiconductor industry,Control reconfiguration,Embedded system,Scalability | Conference |
Citations | PageRank | References |
0 | 0.34 | 11 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hui Zhu | 1 | 11 | 5.45 |
| Sebastien Le Beux | 2 | 3 | 0.80 |
| Nataliya Yakymets | 3 | 27 | 6.27 |
| Ian O'Connor | 4 | 11 | 3.29 |