Paper Info
Title
Using partial masking in X-chains to increase output compaction for an X-canceling MISR
Abstract
An X-Canceling MISR [Touba 07] provides the ability to tolerate unknowns (X's) in the output response with very little loss of observability of non-X values. When the density of X's is low, an X-Canceling MISR is extremely efficient as the number of control bits depends only on the total number of X's in the output response. However, for higher X-densities, an X-Canceling MISR becomes less efficient. This paper describes a very effective approach for using an X-Canceling MISR for designs with high X-density. It utilizes the idea of stitching together scan cells that capture the largest number of X's into "X-chains" as was proposed in [Wohl 08]: In the proposed approach, a partial X-masking approach is used for the X-chains to eliminate the vast majority of the X's at very little cost in terms of control bits. Only the X's coming from the scan cells not in the X-chains plus X's that are left unmasked in the X-chains need to be handled by the X-canceling MISR thereby significantly reducing the total number of control bits required. Experimental results show an order of magnitude improvement in the output compaction can be achieved.
Year
DOI
Venue
2012
10.1109/DFT.2012.6378193
DFT
Keywords
DocType
Citations 
largest number,control bit,output compaction,effective approach,partial X-masking approach,total number,proposed approach,output response,X-Canceling MISR,partial masking,X-canceling MISR,experimental result
Conference
2
PageRank 
References 
Authors
0.37
0
1
Name
Order
Citations
PageRank
M. Tauseef Rab120.37