Name
Abstract | ||
|---|---|---|
Parameter variations, which are increasing along with advances in process technologies, affect both timing and power. Variability must be considered at both the circuit and microarchitectural design levels to keep pace with performance scaling and to keep power consumption within reasonable limits. This article presents an overview of the main sources of variability and surveys variation-tolerant circuit and microarchitectural approaches. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/MM.2006.122 | IEEE Micro |
Keywords | Field | DocType |
surveys variation-tolerant circuit,reasonable limit,microarchitectural design level,parameter variation,main source,power consumption,process technology,microarchitectural approach,parameter variations,performance scaling,circuit design,low power electronics | Work in process,Computer science,Voltage,Parallel computing,Circuit design,Process design,Electronic circuit,Scaling,Low-power electronics,Microarchitecture | Journal |
Volume | Issue | ISSN |
26 | 6 | 0272-1732 |
Citations | PageRank | References |
52 | 1.80 | 15 |
Authors | ||
7 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Osman S. Unsal | 1 | 575 | 55.65 |
| James Tschanz | 2 | 963 | 121.38 |
| Keith A. Bowman | 3 | 977 | 138.36 |
| Vivek De | 4 | 3024 | 577.83 |
| Xavier Vera | 5 | 552 | 30.31 |
| Antonio González | 6 | 3178 | 229.66 |
| Oguz Ergin | 7 | 424 | 25.84 |